Located primarily on the 6^th floor of the Engineering Education and Research Building (EER), the MAS facility provides state-of-the-art instrumentation for analyzing the surface composition of materials, the surface topology, and the crystallinity of materials. This includes multiple x-ray photoemission spectroscopy (XPS), time of flight secondary ion mass spectroscopy, various x-ray diffraction systems, atomic force microscopy, scanning electron microscopy, surface profilometers, and air-free sample preparation setups. On the 5^th floor of EER, the materials property lab provides access absorption and fluorescence spectrometers, Raman spectroscopy, FTIR, DLS, and rheology measurements.