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Hitachi IM4000C Broad Beam Ion Milling System
Contact: Dr. Hugo Celio
Email: hcelio@utexas.edu
Location: EER 6.636
Equipment Type:
Nano and Micro Fabrication
Instrument Capabilities
The Hitachi IM4000C is an argon ion milling system which combines cross-section milling and flat milling in one instrument. It is used primarily for high-quality sample preparation for SEM, EBSD, and other surface/cross-sectional characterization. The system is connected to an argon glovebox to prepare sample cross sectional surfaces that can be air-free transferred using the Rox interface for analysis to either the XPS and/or TOFSIMS.
Key features:
- Up to 6 kV Argon ion energy.
- Sample size up to 25 mm x 50 mm.
- Stage movement of up 7 mm.
- Stage rotation during milling as well as tilting.
- Cross-sectioning using a mask.
- Maximum milling rate of 20 micron per hour for spot milling of Si.
- Maximum milling rate of 2 micron per hour for flat milling of Si for an area of 5 mm diameter.
- Maximum milling rate of 300 micron per hour for cross sections in Si.
Fees and Policies
- UT Users: $19/hour
- Higher Education/State Agencies: $58/hour
- Corporate/External Users: $57/hour
Traning
Please contact Dr. Hugo Celio to schedule a training session.
