Kratos X-ray Photoelectron Spectrometer - Axis Ultra DLD

Information the Equipment Can Provide

This multi-technique with photoelectron and ion spectroscopies, including surface-mapping capabilities, was purchased from Kratos Analytical in 2007 to determine surface elemental and composition analysis. Most samples can be analyzed in a non-invasive or non-destructive method. This instrument is equipped with additional techniques:

• X-ray photoelectron spectroscopy (XPS) provides information on elemental composition and chemical bonding states of materials
• Ultraviolet photoelectron spectroscopy (UPS) provides information on valence levels and work function measurements of materials
• Low energy Ion Scattering spectroscopy (ISS) provides provide evaluation of the elemental composition and structure of solid surfaces
• XPS mode is also capable of surface mapping to provide lateral distribution maps of elemental and chemical species at the surface

Key Features

• Signal detected: Photoelectron from near surface atoms
• Elements detected: From Lithium to heavy metals
• Detection limits: 0.1 to 1 atomic %.
• Depth resolution: 2 to 8 nm
• Depth Profile: 0.5 nm/second using Argon ions
• Lateral resolution: 15 to 500 microns

The Kratos XPS is also equipped with a set of chambers and a capsule (collectively called ROX interface) to transfer air sensitive samples from an argon (or nitrogen) filled glove box to the XPS surface analysis chamber, which is under ultra-high vacuum (UHV). The Rox Interface was designed and developed at the Texas Materials Institute (U.S. Patent Application Serial No. 14/445,650 filed July 29, 2014). Unlike commercial interfaces, the Rox interface was designed with a unique innovation, as it has a built-in semi-quantitative method to monitor sample transfer reliability and validity.

Fees and Policies

• UT Users: $60/hour
• Higher Education/State Agencies: $212/hour
• Corporate/External Users: $293/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.

HF Hood

HF Hood Use Requirements:

This hood is dedicated exclusively to hydrofluoric acid (HF)-based processes. Users may operate the hood only after completing the required training.

General Requirement

• • Users are required to work in pairs when using the HF hood.
  • HF hood use is permitted only between 8:00 AM and 5:00 PM Monday - Friday.
  • Although there is no fee for using the HF hood, users must:
    • Reserve the hood through FBS before use.
    • Start the FBS timer when beginning their work.

The following chemical is approved for use in the TMI cleanroom HF hood:

• Buffered Oxide Etchant (BOE) from Transene, a mixture of ammonium hydrogen difluoride, hydrofluoric acid, and water.

Use of any other HF-containing chemical, mixture, or formulation requires prior approval from the facility manager.

Fees and Policies

Only the cleanroom entry fee will be charged.

• UT Users $6
• Higher Education/State Agencies: $10
• Corporate/External Users: $10

Traning

Please contact Dr. Raluca Gearba and/or James Smitherman to schedule a training session.

Rigaku Miniflex 600 Diffractometer I

Information the Equipment Can Provide

The MiniFlex 600 is a fast, powerful, compact benchtop x-ray diffraction system. Its capabilities include identification of crystalline phases, crystallinity, crystallite size, crystal structure determination. Sample holders for air/moisture sensitive sample are available.

Fees and Policies

• UT Users: $7/hour
• Higher Education/State Agencies: $45/hour
• Corporate/External Users: $45/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.