Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Information the Equipment Can Provide

The NX10 Atomic Force Microscope (AFM) is equipped with a variety of imaging modes which include:

• Standard modes:
  • Contact and LFM
  • Tapping mode
  • F/D Spectroscopy and Force Volume Imaging
  • Nanoindentaion
• SPECIAL: true Non-Contact AFM
• Magnetic Force Microscopy
• Scanning Ion Conductance Microscopy (SICM): lateral resolution 80-100 nm
• Electrical measurements: KPFM, PinPoint conductive AFM, I-V Spectroscopy, Electrostatic Force Microscopy
• Imaging in liquids (contact mode) coming soon!

Features

• The system is equipped with an acoustic enclosure. However, the system is operated more commonly inside a glovebox where the oxygen and water are controlled/monitored.
  • Humidity control from 2 to 90%.
  • O2 level in the 100 ppm range (working gas Ar and N2).
• Independent 2D flexure-guided XY scanner structure for the sample scanning and positioning, separated from the topography feedback mechanism of the Z scanner. The Flexure-guided XY scanner is used to maintain zero background curvature.
• 100 μm by 100 μm scan area with closed looped position control
• Z range of 15 μm
• Sample size: up to 100 × 100 mm (less than 50 × 50 mm recommended), 20 mm thickness
• Includes a magnetic sample holder
• Motorized XY scanner with a travel range of 20 by 20 mm, step 0.6 microns
• Motorized Z stage with a travel range of 22 mm, step 0.08 microns
• Temperature controlled stage from ambient up to 250°C (sample size 18 by 18 mm)
• Engaging on the sample is fully automatic
• AFM sensors can be purchase pre-mounted with minimal laser alignment necessary.

Fees and Policies

• UT Users: $17/hour
• Higher Education/State Agencies: $40/hour
• Corporate/External Users: $40/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.