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Photo of Microscopy/Surface Analysis

Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS M6)

Contact: Dr. Andrei Dolocan
Email:
Location: EER 6.636

Equipment Type:

Microscopy/Surface Analysis

Surface Analysis

Instrument Capabilities

The M6 is an ultra-high-resolution mass spectrometer capable of mass resolution down to 0.001 a.m.u. It provides comprehensive chemical composition analysis of both surfaces and bulk materials, with a mass range extending up to 14,000 a.m.u. The instrument offers elemental sensitivity at concentrations as low as parts-per-billion (ppb), while its surface-sensitive capabilities enable analysis of the outermost few atomic layers of a material.

Key features:

  • Surface Spectroscopy:
    • elemental and molecular ppb sensitivity
    • < 1 nm surface sensitivity
    • >30,000 mass resolution (m/δm)
    • mass range up 14000 a.m.u.
  • Surface Imaging:
    • lateral resolution < 50 nm
    • parallel mass detection
  • Depth Profiling:
    • depth resolution < 1 nm
    • thin films from < 1 nm to few hundreds μm
    • atomic mixing at buried interfaces
  • 3D Analysis:
    • high depth resolution
    • high lateral resolution
    • parallel mass detection
  • Liquid Metal Ion Gun (LMIG)
    • Binm+ source for analysis
    • < few pA beam current – static SIMS limit
    • 30 keV and 60 keV ion energy
    • < 50 nm lateral resolution
  • Dual Source Column (DSC)
    • high current Cs+, O2+, and Ar+ sources for sputtering
    • > 40 nA to > 1 µA beam current
    • 250 eV to 2 keV ion energy
  • Gas Cluster Ion Beam (GCIB)
    • high current Arn+ source for depth profiling of large organic molecules
  • Focused Ion Beam (FIB)
    • high current Ga+ (30 keV) source for fast FIB
    • imaging in cross section of very difficult samples
  • Data Analysis:
    • complete data recording (mass, position and intensity)
    • data can be revisited anytime for additional analysis without further sample analysis
  • Air-free Sample Transfer Capability:
    • air-free capsule available for sample transfer to and from user glove boxes
    • heating (up to 900 K) and cooling (down to 80 K) are available

Accepted Samples: metals, semiconductors, insulators, organic or inorganic, in solid or powder (needs to be pressed) form, fluid inclusions

Available Sputtering Species:

  • Analysis Species: Bi1+ (30 kV), Bi3+ (30 kV), Bi3++ (60 kV), Arn+ cluster
  • Sputtering Species: Cs+ or O2+ (250 V to 2 kV), Arn+ cluster and Ga+

Fees and Policies

  • UT Users: $65/hour
  • Higher Education/State Agencies: $248/hour
  • Corporate/External Users: $248/hour

Training

Users should register for the required in-person training course through UTLearn.