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RHK ATM 300 STM

Contact: Dr. Raluca Gearba
Email:
Location: EER 0.746

Equipment Type:

Microscopy/Surface Analysis

Scanning Tunneling Microscopes (STM)

Instrument Capabilities

The ATM 300 STM is an ambient scanning tunneling microscope (STM) from RHK. The instrument is designed for atomic-scale imaging and characterization of electrically conductive surfaces using the tunneling current between a sharp probe tip and the sample.

Key features:

  • 5 × 5 µm XY scan range, 0.5 Å lateral resolution and 0.1 Å Z resolution
  • Thermal drift below 1 Å/min
  • Tunneling current <1pA
  • Bias voltage: ±1V or ±10V with 10 turn potentiometer
  • Atomic-resolution surface imaging
  • Constant-current and constant-height STM imaging
  • Local surface morphology and atomic structure
  • Electronic characterization through I–V spectroscopy
  • Local density-of-states measurements using scanning tunneling spectroscopy (STS), when configured appropriately
  • Investigation of surface defects, steps, terraces, adsorbates, and atomic-scale structures
  • Measurements on conductive or semiconductive materials

Fees and Policies

  • UT Users: $5/hour
  • Higher Education/State Agencies: $12/hour
  • Corporate/External Users: $12/hour

Traning

Please contact Dr. Raluca Gearba to schedule a training session.