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RHK ATM 300 STM
Contact: Dr. Raluca Gearba
Email: gearba@austin.utexas.edu
Location: EER 0.746
Equipment Type:
Microscopy/Surface Analysis
Scanning Tunneling Microscopes (STM)
Instrument Capabilities
The ATM 300 STM is an ambient scanning tunneling microscope (STM) from RHK. The instrument is designed for atomic-scale imaging and characterization of electrically conductive surfaces using the tunneling current between a sharp probe tip and the sample.
Key features:
- 5 × 5 µm XY scan range, 0.5 Å lateral resolution and 0.1 Å Z resolution
- Thermal drift below 1 Å/min
- Tunneling current <1pA
- Bias voltage: ±1V or ±10V with 10 turn potentiometer
- Atomic-resolution surface imaging
- Constant-current and constant-height STM imaging
- Local surface morphology and atomic structure
- Electronic characterization through I–V spectroscopy
- Local density-of-states measurements using scanning tunneling spectroscopy (STS), when configured appropriately
- Investigation of surface defects, steps, terraces, adsorbates, and atomic-scale structures
- Measurements on conductive or semiconductive materials
Fees and Policies
- UT Users: $5/hour
- Higher Education/State Agencies: $12/hour
- Corporate/External Users: $12/hour
Traning
Please contact Dr. Raluca Gearba to schedule a training session.
