Information the Equipment Can Provide
This multi-technique with photoelectron and ion spectroscopies, including surface-mapping capabilities, was purchased from Kratos Analytical in 2007 to determine surface elemental and composition analysis. Most samples can be analyzed in a non-invasive or non-destructive method. This instrument is equipped with additional techniques:
- X-ray photoelectron spectroscopy (XPS) provides information on elemental composition and chemical bonding states of materials
- Ultraviolet photoelectron spectroscopy (UPS) provides information on valence levels and work function measurements of materials
- Low energy Ion Scattering spectroscopy (ISS) provides provide evaluation of the elemental composition and structure of solid surfaces
- XPS mode is also capable of surface mapping to provide lateral distribution maps of elemental and chemical species at the surface
Key Features
- Signal detected: Photoelectron from near surface atoms
- Elements detected: From Lithium to heavy metals
- Detection limits: 0.1 to 1 atomic %.
- Depth resolution: 2 to 8 nm
- Depth Profile: 0.5 nm/second using Argon ions
- Lateral resolution: 15 to 500 microns
The Kratos XPS is also equipped with a set of chambers and a capsule (collectively called ROX interface) to transfer air sensitive samples from an argon (or nitrogen) filled glove box to the XPS surface analysis chamber, which is under ultra-high vacuum (UHV). The Rox Interface was designed and developed at the Texas Materials Institute (U.S. Patent Application Serial No. 14/445,650 filed July 29, 2014). Unlike commercial interfaces, the Rox interface was designed with a unique innovation, as it has a built-in semi-quantitative method to monitor sample transfer reliability and validity.
Fees and Policies
- UT Users: $60/hour
- Higher Education/State Agencies: $212/hour
- Corporate/External Users: $293/hour
To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.
